Netzwerk Graphen

+49 3375 508 429   friedhelm.heinrich@th-wildau.de
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Publikationen TH Wildau

Joachim Bauer, Marko Gutke, Friedhelm Heinrich, Matthias Edling, Vesela Stoycheva, Alexander Kaltenbach, Martin Burkhardt, Martin Gruenefeld, Matthias Gamp, Christoph Gerhard, Patrick Steglich, Sebastian Steffen, Michael Herzog, Christian Dreyer, and Sigurd Schrader
September 2020
Publikation

J.Bauer, O.Fursenko, S.Marschmeyer, F.Heinrich, F. Villasmunta, C.Villringer, C. Zesch, S. Schrader
Journal of Vacuum Science & Technology B37, 062205
November 2019
Publikation

H. Lux, M. Edling, P. Siemroth, S. Schrader
Materials 2018, 11(5), 804; https://doi.org/10.3390/ma11050804
May 2018
Publikation


O. Fursenko, M. Lukosius, G. Lupina, J. Bauer, C. Villringer, A. Mai
Proc. SPIE. 10330
Modeling Aspects in Optical Metrology VI
26 June 2017
Publikation


H. Lux, P. Siemroth, M. Edling, S. Schrader
Graphen Genua (Italy)
2016
Conference Contribution (Poster)


H. Lux, P. Siemroth, A. Sgarlata, P. Prosposito, M. A. Schubert, M. Casalboni, S. Schrader
Journal of Applied Physics. 117 (19)
2015
Publikation


H. Lux, C. Villringe, P. Siemroth, M. Casalboni, A. Sgarlata, M.A. Schubert, S. Schrader
Graphene Bilbao (Spain)
2015
Conference Contribution (Oral Presentation)


C. Villringer, H. Lux, P. Steglich, J. M. Bauer, S. Dümecke, M. A. Schubert, S. Schrader
Graphene Bilbao (Spain)
2015
Conference Contribution (Poster)


C. Villringer, H. Lux, P. Steglich, J. M. Bauer, S. Schrader
9th Workshop Ellipsometry, (Twente)
2015
Conference Poster


Optical properties of graphene determined by spectroscopic ellipsometry, reflectometry and transmission photometry
C. Villringer, J. Bauer, H. Lux, P. Steglich, S. Schrader, F. De Matteis, M. Casalboni, O. Fursenko, G. Lippert, G. Lupina, J. Kitzmann and M. A. Schubert
8th Workshop Ellipsometry, (Dresden)
March 10-12 2014
Conference Poster

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